X-荧光分析基本参数法FLY-FPM软件系统投入使用

X-荧光分析基本参数法基于严格的理论计算对被分析样品的基体效应进行有效的校正,从而提高分析的准确性。地化所丰梁垣开发的基本参数法FLY-FPM软件系数,适用于元素系统各种合金、素化合物等、氧化物系统(硅酸盐等)以及混合样品系统(如元素-氧化物系统),可以测定样品中Na(11)—U(92)间所有元素,     

国际地球化学标准参考样品分析

The analytical procedures used for many years in our institute for rock analysis are tested against 18 international geochemical reference samples provided by CRPG, ANRT and USGS. The validity of our method and its suitability for widely different samples are substantiated by the good agreement between our results and the recommended values.