| Abstract: | A numerical method is presented for direct interpretation of resistivity sounding measurements. The early part of the resistivity transform curve derived from field observations by standard methods is approximated by a two-layer curve. The resistivity of the first layer is determined from the arithmetic mean of the successive computations which are carried on each of three successive discrete values of the resistivity transform curve. Using this mean value of the resistivity, the thickness of the first layer is computed from the sample values in pairs of the resistivity transform curve. After these determinations, the top layer is removed by Pekeris's reduction equation. The parameters of the second layer are obtained from the discrete values of the reduced transform curve (which corresponds to the second part of the resistivity transform curve) by the same procedure as described for the first layer. The same computational scheme is repeated until the parameters of all intermediate layers are obtained. The resistivity of the substratum is determined from the reduction equation. |
