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Estimation of areal specific yield in sands using the central limit theorem
Authors:Stephen B K Tan  E B Shuy  Lloyd H C Chua  Ngonidzashe Mzila
Abstract:A new approach is demonstrated that permits a reliable estimate of specific yield using published values of the van Genuchten water retention parameters and effective grain sizes and the measured effective grain sizes of soil samples. The specific yield distribution of the soil texture was computed using the published values of the van Genuchten parameters. The specific yield values and the published values of effective grain sizes were then used to construct a specific yield–effective grain size curve, which estimates the ‘point’ specific yield of the soil samples. Applying the central limit theorem, the point specific yields could be transformed into an ‘areal’ specific yield for a study area. Compared with other commonly used approaches, the present procedure requires relatively low computational efforts and readily obtainable data. It is cost effective and does not depend on soil texture classification. More importantly, it incorporates the depth to water table and the variations in grain sizes inherent in natural soil conditions in the estimation. The approach developed was applied for estimating the specific yield of an unconfined sandy aquifer created by land reclamation in the equatorial region. The values obtained were compared with field measurements and the typical ranges of specific yield from the literature. Instead of a single estimate of the specific yield, the method yields a confidence interval with a high confidence level of 95% and with a narrower range than the typical ranges from the literature. In addition, the estimated values are close to the field measurements; hence, the procedure provides a cost‐effective alternative to field measurement. The applicability of the present approach could be extended to sites with heterogeneity in the horizontal direction. Nevertheless, the applicability of the present approach for layered soil profiles requires further evaluations. Copyright © 2006 John Wiley & Sons, Ltd.
Keywords:specific yield estimation  specific yield–  effective grain size curve  van Genuchten parameters  central limit theorem
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