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CMOS Detector Technology
Authors:Alan Hoffman  Markus Loose  Vyshnavi Suntharalingam
Institution:(1) Raytheon Vision Systems, Goleta, USA;(2) Rockwell Scientific Company, Thousand Oaks, USA;(3) MIT Lincoln Laboratory, Lexington, USA
Abstract:An entry level overview of state-of-the-art CMOS detector technology is presented. Operating principles and system architecture are explained in comparison to the well-established CCD technology, followed by a discussion of important benefits of modern CMOS-based detector arrays. A number of unique CMOS features including different shutter modes and scanning concepts are described. In addition, sub-field stitching is presented as a technique for producing very large imagers. After a brief introduction to the concept of monolithic CMOS sensors, hybrid detectors technology is introduced. A comparison of noise reduction methods for CMOS hybrids is presented. The final sections review CMOS fabrication processes for monolithic and vertically integrated image sensors.
Keywords:APS  active pixel sensor  CCD  CMOS  focal plane array  HgCdTe  hybrid  image sensor  InSb  three-dimensionally stacked circuits  vertical integration
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