微米级炸药晶体缺陷的μVCT试验研究

炸药晶体内部缺陷是影响炸药材料性能的一个关键因素。本文利用微焦点X射线体式CT(μVCT)技术研究了典型炸药奥克托今(HMX)晶体的内部结构,并对HMX晶体的孔隙率进行了定量分析。结果发现一般HMX晶体内部含有较多的微米级孔隙,其面孔隙率可高达1%~2%,揭示了炸药件初始损伤的存在并解释了炸药晶体密度与其理论密度有差异的原因;而经过一定工艺处理后的HMX晶体内部孔隙则有效地减少,晶体密度和材料性能均能明显提升。研究表明对于几十微米以上尺寸的HMX炸药晶体,μVCT可有效地研究其内部结构并实现对其内部细小孔隙缺陷的定量,为深入研究炸药件成型性能和损伤破坏机理提供了一种直观的、可靠的实验手段。

Experiment Study on Micron Crystal Defect of Explosive Based on μVCT

The inner defect of explosive crystal is one of the key factors that affect the performance of explosive material.The structure of typical crystal explosive(HMX) is studied with microfocus x-ray industrial volume CT(μVCT) and the micro hole ratio is quantificationally analyzed in this paper.The results indicate that micron holes are extensively presented in HMX crystal and the micro hole ratio is up to 1%~2%,which reveal initial damage existence in explosive parts and the difference between theoretical density and actual density of crystal.The micro hole of HMX crystal may reduce effectively and density and performance are improved after a certain technical treat.The inner structure and micro hole ratio measurement can be effectively studied with μVCT for HMX crystal over tens of micron.This research provides an intuitionistic reliable experimental means for studying molding performance and damage destruction mechanism of explosive parts.