Aluminium grain boundary diffusion in polycrystalline mullite ceramics |
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Authors: | P Fielitz G Borchardt M Schmücker H Schneider |
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Institution: | 1.Fakult?t für Natur- und Materialwissenschaften, Institut für Metallurgie,Technische Universit?t Clausthal,Clausthal-Zellerfeld,Germany;2.Institut für Werkstoff-Forschung, Deutsches Zentrum für Luft- und Raumfahrt,K?ln,Germany |
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Abstract: | Aluminium tracer diffusivities were measured in polycrystalline mullite. The artificial aluminium isotope 26Al was used as tracer isotope. An advanced preparation technique for the 26Al2O3 tracer source allowed to apply secondary ion mass spectrometry (SIMS) in order to analyse 26Al depth distributions in the polycrystalline material. Pre-exponential factors and activation enthalpies were determined
for compositions of 78 wt.% Al2O3, 22 wt.% SiO2 (high-alumina material) and of 72 wt.% Al2O3, 28 wt.% SiO2 (low-alumina material), respectively. A strong dependence of the 26Al grain boundary diffusivity on the composition is observed. The results are discussed in comparison to previous data on
grain boundary diffusivities of oxygen in mullite samples from the same batch.
Dedicated to Prof. Hermann Schmalzried on the occasion of his 75th birthday. |
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Keywords: | Mullite Aluminium grain boundary diffusion 26Al SIMS |
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