Diffraction imaging by uniform asymptotic theory and double exponential fitting

Seismic diffracted waves carry valuable information for identifying geological discontinuities. Unfortunately, the diffraction energy is generally too weak, and standard seismic processing is biased to imaging reflection. In this paper, we present a dynamic diffraction imaging method with the aim of enhancing diffraction and increasing the signal‐to‐noise ratio. The correlation between diffraction amplitudes and their traveltimes generally exists in two forms, with one form based on the Kirchhoff integral formulation, and the other on the uniform asymptotic theory. However, the former will encounter singularities at geometrical shadow boundaries, and the latter requires the computation of a Fresnel integral. Therefore, neither of these methods is appropriate for practical applications. Noting the special form of the Fresnel integral, we propose a least‐squares fitting method based on double exponential functions to study the amplitude function of diffracted waves. The simple form of the fitting function has no singularities and can accelerate the calculation of diffraction amplitude weakening coefficients. By considering both the fitting weakening function and the polarity reversal property of the diffracted waves, we modify the conventional Kirchhoff imaging conditions and formulate a diffraction imaging formula. The mechanism of the proposed diffraction imaging procedure is based on the edge diffractor, instead of the idealized point diffractor. The polarity reversal property can eliminate the background of strong reflection and enhance the diffraction by same‐phase summation. Moreover,the fitting weakening function of diffraction amplitudes behaves like an inherent window to optimize the diffraction imaging aperture by its decaying trend. Synthetic and field data examples reveal that the proposed diffraction imaging method can meet the requirement of high‐resolution imaging, with the edge diffraction fully reinforced and the strong reflection mostly eliminated.