Graphitization of Korean anthracites as studied by transmission electron microscopy and X-ray diffraction

The different modes of high-resolution transmission electron microscopy (TEM) were applied to Korean anthracites, semi-graphites and graphites. Whereas X-ray diffraction data yield averaged values, TEM is the only technique able to bring out the heterogeneity of phases which are different in morphology and in microtexture. The thermal behavior of samples was studied using laboratory heat-treatments up to 2800°C. In heat-treated anthracites for example, an increasing degree of graphitization results in phase changes which can be quantified by TEM. The study of a larger sampling appears however necessary to relate crystallographic variations to geological data.