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XRF Determination of 17 Trace Elements in Geological Samples Using an Extended Compton Scattering Correction Procedure
引用本文:丰梁垣 鲍惠兰 等. XRF Determination of 17 Trace Elements in Geological Samples Using an Extended Compton Scattering Correction Procedure[J]. 中国地球化学学报, 1990, 9(1): 77-85. DOI: 10.1007/BF02837950
作者姓名:丰梁垣 鲍惠兰 等
作者单位:InstituteofGeochemistry,AcademiaSinica,Guiyang
摘    要:This work is intended to explore a fast and effective apoproach to the determination of various trace elements in geological samples throuth improvement and simplification of the method developed by Reynolds (1963,1967),Absorption correction was made for the Fe content to eliminate the effect caused by inconsistency in mass absorption coefficients among the samples.A computer-aid regression analysis was performed on a number of standards of various compositions,which resulted in a set of calibration equations for directly converting X-ray intensities to concentrations.An analytical error of 10-30% was involved in the analyses of most elements.

关 键 词:XRF分析 X射线 示踪元素 地质样品

XRF determination of 17 trace elements in geological samples using an extended Compton scattering correction procedure
Feng Liangyuan,Bao Huilan,Li Ruoling,Zhang Yawen. XRF determination of 17 trace elements in geological samples using an extended Compton scattering correction procedure[J]. Chinese Journal of Geochemistry, 1990, 9(1): 77-85. DOI: 10.1007/BF02837950
Authors:Feng Liangyuan  Bao Huilan  Li Ruoling  Zhang Yawen
Affiliation:(1) Institute of Geochemistry, Academia Sinica, Guiyang
Abstract:This work is intended to explore a fast and effective approach to the determination of various trace elements in geological samples through improvement and simplification of the method developed by Reynolds (1963, 1967). Absorption correction was made for the Fe content to eliminate the effect caused by inconsistency in mass absorption coefficients among the samples. A computer-aid regression analysis was performed on a number of standards of various compositions, which resulted in a set of calibration equations for directly converting X-ray intensities to concentrations. An analytical error of 10–30% was involved in the analyses of most elements.
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