Use of VFSA for resolution, sensitivity and uncertainty analysis in 1D DC resistivity and IP inversion

We present results from the resolution and sensitivity analysis of 1D DC resistivity and IP sounding data using a non-linear inversion. The inversion scheme uses a theoretically correct Metropolis–Gibbs' sampling technique and an approximate method using numerous models sampled by a global optimization algorithm called very fast simulated annealing (VFSA). VFSA has recently been found to be computationally efficient in several geophysical parameter estimation problems. Unlike conventional simulated annealing (SA), in VFSA the perturbations are generated from the model parameters according to a Cauchy-like distribution whose shape changes with each iteration. This results in an algorithm that converges much faster than a standard SA. In the course of finding the optimal solution, VFSA samples several models from the search space. All these models can be used to obtain estimates of uncertainty in the derived solution. This method makes no assumptions about the shape of an a posteriori probability density function in the model space. Here, we carry out a VFSA-based sensitivity analysis with several synthetic and field sounding data sets for resistivity and IP. The resolution capability of the VFSA algorithm as seen from the sensitivity analysis is satisfactory. The interpretation of VES and IP sounding data by VFSA, incorporating resolution, sensitivity and uncertainty of layer parameters, would generally be more useful than the conventional best-fit techniques.