地表粗糙度参数化研究综述

粗糙度反映了地表的起伏程度，是许多陆面过程的关键影响因子。然而，人们对地表系统认识的不足，造成现有的各种地表粗糙度参数化方案均存在一定的问题。从地表测量技术、粗糙度相关参数和遥感研究3个方面对地表粗糙度参数化研究现状进行了综述。针式廓线法和激光廓线法是当前主流的地表测量技术，而三雏激光扫描和摄影测量技术已展示出了较大的潜力。基于统计方法和基于分形理论的粗糙度相关参数具有截然不同的物理意义，但地表复杂的多尺度特性使得很难用一类参数进行描述。光学遥感与微波遥感均具有广阔的前景，其中前者需要注意与经典粗糙度参数化方案相结合，后者则需拓展在下一代遥感平台上的技术与方法。还针对不同尺度粗糙度参数的比较与转换，地表粗糙度的空间异质性与各向异性，以及三维表面粗糙度参数化等当前地表粗糙度参数化研究中的一些关键问题进行了讨论。

Review of Land Surface Roughness Parameterization Study

Roughness,reflecting the smooth degree of the surface,is a key factor of many land surface processes.There are various methods of parameterization,but questions still exist since the characterization of land surface system has far from been fully understood.This paper reviews the research progress on land surface roughness characterization from three aspects,including land surface measurement techniques,roughness parameters,and remote sensing researches.So far,pin profiler and laser profiler are still main-stream land surface measurement approaches,while 3D laser scan and photogrammetry techniques have shown their potentials.Parameters defined by statistical methods and fractal theories are quite distinct from each other,but it is hard to describe land surface using either category of parameters due to the the complexity of its multi-scaled feature.As for remote sensing researches,both optical and microwave techniques have broad prospects,and the former needs to do better in match with classical parameterization,while the latter has to make improvement on techniques and methods for next generation remote sensing platform.Many key problems encountered in roughness parameterization study,such as comparison and transformation of parameters between different scales,heterogeneity and anisotropy of land surface,as well as roughness parameterization based on 3D surface data,have also been discussed.