Analysis of sorghum yield dependence on crop growth characteristics using noaa-avhrr data

Growth profiles of 1987-88 rabi sorghum crop cultivated in spatially extensive sites in six tehsils of Solapur and Ahmadnagar districts in Maharashtra have been generated using multidate NOAA AVHRR data based on crop growth equation suggested by Badhwar (1980). The sensitive parameters for sorghum yield modelling have been identified. The correlation of final grain yield with growth parameters shows that yield relationship is stronger when logarithmic senescence rate and timeintegrated logarithmic senescence rate are considered as the parameters instead of its value on any day during 30 days senescence period after attaining maximum vegetative cover.