复杂地质样品中铀,钍等成分X射线荧光光谱分析

本文提出了一种用ＸＲＦ测定复杂地质样品全分析中其它特殊成分的分析方法。本方法采用熔融法制备样片，个别元素采用压片法制样，用散射内标法与经验α系数相结合的方法进行基体效应的校正。各氧化物的测定下限分别为：ＳｒＯ０．００３０％，ＺｒＯ２０．００３０％，ＰｂＯ０．００３６％，ＣｕＯ０．００４２％，ＮｉＯ０．００２７％，ＺｎＯ０．００２１％，Ｃｒ２Ｏ３０．００６９％，ＢａＯ０．００４８Ｋ，Ａｓ２Ｏ３０．００１５％，Ｎｂ２Ｏ５０．００４８％，Ｖ２Ｏ５０．００５１％，ＴｈＯ２０．００３６％，Ｕ３Ｏ８０．００３０％，其分析结果的精密度和准确度较好，能够满足地质研究工作的需要。

A STUDY ON SOME OTHER SPECIAL COMPOSITIONS IN SAMPLES FOR COMPLICATED GEOLOGICAL BULK ANALYSISBY X-RAY FLUORESCENCE SPECTROMETRY

An analytical method is presented to determine some other special compositions in samples for complicated geological bulk analysis by X-ray fluorescence spectrometry in this paper. Melting method was adopted to prepare sample slices and pressing-tablets method wasadopted to prepare for a few elements. The matrix effect was corrected by the scattered target--line ratio method in combination with the empirical a-coefficients. The lower limits of determination for various oxides are SrO 0. 0030%, ZrO2 0. 0030%, PbO 0. 0036%, CuO0. 0042%, NiO 0. 0027%, ZnO 0. 0021%, Cr2O3 0. 0069%, BaO 0. 0048%, As2O3 0. 0015%Nb2O3 0. 0048%, V2O5 0. 0051 %, ThO2 0. 0036%, U3O3 0. 0030%, respectively. Precision andaccuracy of the analytical results for this method are good,which can meet the requirementso f geological research work.