Crustal reflection seismics: the contributions of oblique, low frequency and shear wave illuminations |
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Authors: | A Hirn B Damotte G Torreilles ECORS Scientific Party |
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Institution: | Laboratoire de Sismologie, associéau CNRS, Institut de Physique du Globe de Paris, 4 place Jussieu - 75252 Paris Cedex 05 - France |
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Abstract: | Summary. Continuous vertical seismic reflection profiling, the use of which has been extended by COCORP, BIRPS, ECORS, DEKORP and other programmes (Barazangi & Brown 1986) from stratified sedimentary basins to the entire crust, provides a high resolution cross section of reflectivity. A similar extension of oblique or variable offset sounding would be expected only to provide complementary velocity information. However, combined use of the two methods at crustal scale is new, and we show that refractions and wide angle reflections do contribute original and relevant information, but generally in areas other than velocities - the reason being that interfaces and layers may have a different nature in the crystalline crust from that in sediments. |
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