Measurements of the 44-μm band of H2O ice deposited on amorphous carbon and amorphous silicate substrates

We present 20–110 µm absorbance spectra of H₂O ice, deposited on amorphous carbon and silicate substrates, obtained over the 10–140 K temperature range. The measurements have been carried out in a manner that simulates the deposition, warming and cooling of H₂O ice mantles on interstellar and circumstellar grains. For H₂O ice films deposited on these substrates we find (i) similar 44-µm-band peak wavelength temperature dependences, (ii) no bandshape differences in the respective spectra, and (iii) a structural phase transition occurring between 120 and 130 K. In comparison with published data obtained using a polyethylene substrate, the 52-µm feature (the longitudinal optical mode) observed in our spectra is less prominent. This suggests the presence of material-dependent substrate effects that can alter the appearance of the H₂O far-infrared spectrum. The crystallization temperature of H₂O ice films deposited on our amorphous silicate substrate is significantly different from that reported by Moore et al. (1994) , who found crystallization temperatures down to < 20 K for ice also deposited on an amorphous silicate substrate. This is attributed to differences in the surface structures of the respective substrates. This may indicate that, at least in the context of laboratory measurements, substrate material composition is not as significant as substrate surface structure.