谱线形成深度的理论及其应用（Ⅱ）：响应函数的发展

作为系列文章的第二篇，给出了响应函数概念的发展概貌及关于其意义的讨论。这一概念从以单纯考察表面观测量如何随定一深度处物理量的扰动作出反应发展到由此考虑可得出谱线参量结构方面的信息。

Theory of Line Formation Depth and Its Application (II):the Development of Response Function

As the second paper of this series, the development of the concept of the response functionis outlined and its meaning is discussed. The usage of the response function experiences a processfrom the stage of only observing the response of measured surface quantities by the perturbanceof physical parameters at a certain depth to that of deriving the information on the line parameterstructure. The role and the significance of the contribution function and response function arecompared, and the reason why the latter function is superior to the former is pointed out in thederivation of the structure of the parameters.