| 化学计量学与X射线荧光光谱分析 |
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| 引用本文： | 罗立强, 马光祖. 化学计量学与X射线荧光光谱分析[J]. 岩矿测试, 1997, (2): 128-137. |
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| 作者姓名： | 罗立强 马光祖 |
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| 作者单位： | 中国科学院上海硅酸盐研究所，地矿部岩矿测试技术研究所 |
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| 摘 要： | 简要回顾了Ｘ＿射线荧光分析中数学校正模型的发展进程；阐述了基体校正方程与化学计量学之间的关系；介绍了偏最小二乘回归、神经网络、专家系统和模式识别等近期研究成果；以及轻元素测定、微束和薄层分析等数据处理技术。并对化学计量学方法在Ｘ＿射线荧光分析中的应用与发展前景作了评述
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| 关 键 词： | 化学计量学 X射线荧光 综述 |
The Application of Chemometrics to X_Ray Fluorescence Analysis |
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| The Application of Chemometrics to X_Ray Fluorescence Analysis[J]. Rock and Mineral Analysis, 1997, (2): 128-137. |
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| Authors: | Luo Liqiang Guo Changlin Ji Ang |
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| Abstract: | Recent work on chemometrics in X_ray fluorescence analysis is reviewed. Emphasis is placed on partial least squares, pattern recognition, neural networks and expert system, because thier extensive use in analytical chemistry and important role in X_ray fluorescence analysis. In addition, special attention is also paid to the development of microbeam X_ray fluorescence, coating and thin films, and light element analysis. |
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| Keywords: | chemometrics X_ray fluorescence review |
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