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A high P-T single-crystal X-ray diffraction study of thermoelasticity of MgSiO3 orthoenstatite
Authors:Yusheng Zhao  David Schiferl  Thomas J Shankland
Institution:1. Los Alamos National Laboratory, NM 87545, Los Alamos, USA
Abstract:P-V-T data of MgSiO3 orthoenstatite have been measured by single-crystal X-ray diffraction at simultaneous high pressures (in excess of 4.5 GPa) and temperatures (up to 1000 K). The new P-V-T data of the orthoenstatite, together with previous compression data and thermal expansion data, are described by a modified Birch-Murnaghan equation of state for diverse temperatures. The fitted thermoelastic parameters for MgSiO3 orthoenstatite are: thermal expansion ?α/?P with values of a=2.86(29)×10-5 K-1 and b=0.72(16)×10-8 K-2; isothermal bulk modulus K T o =102.8(2) GPa; pressure derivative of bulk modulus K′=?K/?P=10.2(1.2); and temperature derivative of bulk modulus K=?K/?T=-0.037(5) GPa/K. The derived thermal Grüneisen parameter is γ th=1.05 for ambient conditions; Anderson-Grüneisen parameter is δ T o =11.6, and the pressure derivative of thermal expansion is ?α/?P=-3.5×10-6K-1 GPa-1. From the P-V-T data and the thermoelastic equation of state, thermal expansions at two constant pressures of 1.5 GPa and 4.0 GPa are calculated. The resulting pressure dependence of thermal expansion is Δα/ΔP=-3.2(1)× 10-6 K-1 GPa-1. The significantly large values of K′, K, δ T and ?α/?P indicate that compression/expansion of MgSiO3 orthoenstatite is very sensitive to changes of pressure and temperature.
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