Mars: Subsurface properties from observed longitudinal variation of the 3.5-mm brightness temperature |
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| Authors: | Eugene E. Epstein Bryan H. Andrew Frank H. Briggs Bruce M. Jakosky Frank D. Palluconi |
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| Affiliation: | Electronics Research Laboratory, The Aerospace Corporation, Box 92957, Los Angeles, California 90009, USA;Herzberg Institute of Astrophysics, National Research Council of Canada, Ottawa, Canada K1A 0R6;Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, Pennsylvania 15260, USA;Laboratory for Atmospheric & Space Physics, University of Colorado, Boulder, Colorado 80309, USA;Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109, USA |
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| Abstract: | Measurements at 3.5 mm of the disk-average brightness temperature of Mars during the 1978 opposition can be represented by (The errors cited are from the internal scatter; the estimated absolute calibration uncertainty is 3%.) This longitudinal variation must be taken into account if Mars is to be used as a calibration source at millimeter wavelengths. The total range of the 3.5-mm variation is three to four times larger than both the 2.8-cm and 20-μm variations. This unexpected result can possibly be explained by subsurface scattering from rocks ?1.5-cm radius. |
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| Keywords: | To whom all correspondence should be addressed. |
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