Image processing of 2D resistivity data for imaging faults |
| |
Affiliation: | 1. Department of Energy, Systems, Territory and Construction Engineering, University of Pisa, Via C.F. Gabba, 22, 56122 Pisa, PI, Italy;2. Department of Civil and Environmental Engineering, University of Florence, Via di Santa Marta, 3, 50139 Firenze, FI, Italy;1. Departamento de Ciencias de la Tierra, Universidad de Zaragoza, C/. Pedro Cerbuna 12, 50009 Zaragoza, Spain;2. Àrea de Geodinàmica Externa i Geomorfologia, Universitat de Girona, Campus Montilivi, E-17003 Girona, Spain;3. Department of Geosciences, Florida Atlantic University, Davie, FL, USA;4. Departamento de Geología, Universidad Autónoma de Barcelona, E-08193 Barcelona, Spain;1. Aarhus University, Institute of Geoscience, C.F. Møllers Alle 4, 8000 Aarhus C, Denmark;2. Department of Environmental Engineering, Technical University of Denmark, Bygningstorvet, building 115, 2800 Kgs. Lyngby, Denmark;1. Center for Near Surface Geophysics and Archaeological Prospection (CNSGAP), Dokuz Eylül University, 35160 Buca-İzmir, Turkey;2. Engineering Faculty, Department of Geophysical Engineering, Dokuz Eylül University, 35160 Buca-İzmir, Turkey |
| |
Abstract: | A methodology to locate automatically limits or boundaries between different geological bodies in 2D electrical tomography is proposed, using a crest line extraction process in gradient images. This method is applied on several synthetic models and on field data set acquired on three experimental sites during the European project PALEOSIS where trenches were dug. The results presented in this work are valid for electrical tomographies data collected with a Wenner-alpha array and computed with an l1 norm (blocky inversion) as optimization method. For the synthetic cases, three geometric contexts are modelled: a vertical and a dipping fault juxtaposing two different geological formations and a step-like structure. A superficial layer can cover each geological structure. In these three situations, the method locates the synthetic faults and layer boundaries, and determines fault displacement but with several limitations. The estimated fault positions correlate exactly with the synthetic ones if a conductive (or no superficial) layer overlies the studied structure. When a resistive layer with a thickness of 6 m covers the model, faults are positioned with a maximum error of 1 m. Moreover, when a resistive and/or a thick top layer is present, the resolution significantly decreases for the fault displacement estimation (error up to 150%). The tests with the synthetic models for surveys using the Wenner-alpha array indicate that the proposed methodology is best suited to vertical and horizontal contacts. Application of the methodology to real data sets shows that a lateral resistivity contrast of 1:5–1:10 leads to exact faults location. A fault contact with a resistivity contrast of 1:0.75 and overlaid by a resistive layer with a thickness of 1 m gives an error location ranging from 1 to 3 m. Moreover, no result is obtained for a contact with very low contrasts (∼1:0.85) overlaid by a resistive soil. The method shows poor results when vertical gradients are greater than horizontal ones. This kind of image processing technique should be systematically used for improving the objectiveness of tomography interpretation when looking for limits between geological objects. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|