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| 高能偏振能量色散X射线荧光光谱仪应用现状和进展 | |
| 引用本文： | 吉昂,李国会,张华. 高能偏振能量色散X射线荧光光谱仪应用现状和进展[J]. 岩矿测试, 2008, 27(6): 451-462 |
| 作者姓名： | 吉昂 李国会 张华 |
| 作者单位： | 1. 中国科学院上海硅酸盐研究所,上海,200050 2. 中国地质科学院地球物理地球化学勘查研究所,河北,廊坊,065000 3. PANalytieal公司APR应用实验室,上海,200233 |
| 摘 要： | 对高能偏振能量色散X射线荧光光谱仪基本特点及其用于环境、生物、地质样品中痕量元素的分析和RoSH检测等领域的应用现状予以介绍,并对二次靶与滤光片在痕量元素分析中的应用作了探讨。 |
| 关 键 词： | 高能偏振能量色散X射线荧光光谱仪 应用现状 进展 |
| 收稿时间： | 2008-05-25 |
| 修稿时间： | 2008-08-14 |
Application and Development of High-energy Polarized Energy Dispersive X-ray Fluorescence Spectrometer |
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| JI Ang,LI Guo-hui and ZHANG Hua. Application and Development of High-energy Polarized Energy Dispersive X-ray Fluorescence Spectrometer[J]. Rock and Mineral Analysis, 2008, 27(6): 451-462 | |
| Authors: | JI Ang LI Guo-hui ZHANG Hua |
| Affiliation: | Shanghai Institute of Ceramics, Chinese Academy of Sciences;Institute of Geophysical and Geochemical Exploration, Chinese Academy of Geological Sciences;Application Laboratories for PANalytical APR |
| Abstract: | The analytical features of high-energy polarized energy dispersive X-ray fluorescence spectrometer and its application in trace element analysis in environmental, biological, geological and RoSH samples were introduced in this paper. And the application of secondary target and filter in trace element analysis was also discussed. |
| Keywords: | high-energy polarized energy dispersive X-ray fluorescence spectrometer application development |
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