Determination of Selenium Concentrations in NIST SRM 610, 612, 614 and Geological Glass Reference Materials Using the Electron Probe, LA-ICP-MS and SHRIMP II |
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Authors: | Frances E Jenner Peter Holden John A Mavrogenes Hugh StC O'Neill Charlotte Allen |
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Institution: | Research School of Earth Sciences, The Australian National University, Canberra, ACT 0200, Australia |
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Abstract: | A combination of EMPA, sensitive high resolution ion microprobe (SHRIMP II) and/or LA-ICP-MS techniques was used to measure the concentration of selenium (Se) in NIST SRM 610, 612, 614 and a range of reference materials. Our new compiled value for the concentration of Se in NIST SRM 610 is 112 ± 2 μg g−1. The concentration of Se in NIST SRM 612, using NIST SRM 610 for calibration, determined using LA-ICP-MS (confirmed using SHRIMP II) was 15.2 ± 0.2 μg g−1. The concentration of Se in NIST SRM 614, using LA-ICP-MS was 0.394 ± 0.012 μg g−1. LA-ICP-MS determination of Se in synthetic geological glasses BCR-2G, BIR-1G, TB-1G and the MPI-DING glasses showed a range in concentrations from 0.062 to 0.168 μg g−1. Selenium in the natural glass, VG2, was 0.204 ± 0.028 μg g−1. |
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Keywords: | selenium NIST SRM reference materials MPI-DING LA-ICP-MS SHRIMP EMPA BCR-2G |
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