Motion compensation system for ocean profiling |
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| Authors: | EH Kidera SA Mack |
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| Institution: | 1. Ocean Engineering, U.S. Naval Academy, Annapolis, MD 21402, U.S.A.;2. Applied Physics Laboratory, Johns Hopkins University, Laurel, MD 20707, U.S.A. |
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| Abstract: | The vertical profiles of ocean temperature and salinity measured with instruments lowered by cable from surface ships can be seriously affected by the nonuniform drop rate caused by ship motion. This paper describes a motion compensation system developed for conductivity, temperature, and depth profilers that significantly reduces the effect of ship motion on profiler drop rates, thereby enhancing the measurement capabilities of vertical profilers. |
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