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Direct relative orientation with four independent constraints
Authors:Yongjun Zhang  Xu Huang  Xiangyun Hu  Fangqi Wan  Liwen Lin
Institution:1. School of Computer Science & Engineering, South China University of Technology, Guangzhou, Guangdong 510006, China;1. Regional Remote Sensing Centre-East (NRSC), ISRO, Kolkata, West Bengal, India;2. National Remote Sensing Centre, Balanagar, Hyderabad, India;1. Dept. of ECE, SRM University, Chennai, India;2. ECE Dept. Saveetha Engineering College, Chennai, India;1. School of Mechanical, Materials and Mechatronic Engineering, University of Wollongong, Wollongong, NSW 2522, Australia;2. School of Materials Science and Engineering, Tsinghua University, Beijing 100084, China;3. School of Electrical, Mechanical and Mechatronic Systems, University of Technology, Sydney, NSW 2007, Australia;4. Shanxi Provincial Key Laboratory on Metallurgical Device Design and Theory, Taiyuan University of Science and Technology, Shanxi 030024, China
Abstract:Relative orientation based on the coplanarity condition is one of the most important procedures in photogrammetry and computer vision. The conventional relative orientation model has five independent parameters if interior orientation parameters are known. The model of direct relative orientation contains nine unknowns to establish the linear transformation geometry, so there must be four independent constraints among the nine unknowns. To eliminate the influence of over parameterization of the conventional direct relative orientation model, a new relative orientation model with four independent constraints is proposed in this paper. The constraints are derived from the inherent orthogonal property of the rotation matrix of the right image of a stereo pair. These constraints are completely new as compared with the known literature. The proposed approach can find the optimal solution under least squares criteria. Experimental results show that the proposed approach is superior to the conventional model of direct relative orientation, especially at low altitude and close range photogrammetric applications.
Keywords:
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