Silicon negative ion chemistry in the atmosphere-in situ and laboratory measurements

The results of a rocket-borne mass spectrometer measurement indicate that large concentrations of negative ions exist above the bottom of the atmospheric atomic oxygen layer. A large majority of these ions have a mass greater than 100 amu. In addition, an ion at mass 76 was observed with concentrations too large to be CO₄^?. In order to explain these features, a number of reactions involving silicon oxide negative ions have been measured in a flowing afterglow system. The ion SiO₃^? is produced by reaction of O₃^?, and CO₃^?, with SiO. The SiO₃^? ion is extremely stable and does not react measurably with NO, NO₂, CO, CO₂, O₃ or O. Since meteoroid ablation produces a large silicon input into the atmosphere, it appears possible that the ions observed at mass 76 may be SiO₃^?. Possible production mechanisms for this ion as well as the heavy ions are discussed.