Structural change of GeO2 under pressure

Pressure-induced amorphization of α-quartz type GeO₂ was studied with a newly developed X-ray diffraction system which consists of a 4-circle goniometer and a curved position sensitive detector. Single-crystal diffraction was measured under pressurs up to 7.3 GPa at room temperature in order to investigate pretransitional phenomena. Diffraction intensity and line width of the diffraction profiles showed no remarkable change up to 5.9 GPa. However, no sharp diffraction line was observed at pressures over 6.5 GPa. The bulk modulus at 0.1 MPa and its pressure derivative of α-quartz type GeO₂ were determined to be K _T =32.8(3.3) GPa and K′ _T =6.0(2.0), respectively. In situ microscopic observations of the amorphization transformation was also performed. The large volume change due to amorphization was observed and estimated to be about 10%.