| 地质样品中砷、镓、钴、镍、溴、氯、硫和氟的X射线荧光光谱法测定 |
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| 引用本文： | 肖德明,武朝晖. 地质样品中砷、镓、钴、镍、溴、氯、硫和氟的X射线荧光光谱法测定[J]. 铀矿地质, 1990, 0(5) |
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| 作者姓名： | 肖德明 武朝晖 |
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| 摘 要： | 本文叙述了XRF测定地质样品中微量As,Ga,Co,Ni,Br,Cl,S和F的分析方法。采用压片法制样。对As,Ga,Co,Ni和Br元素,用散射内标法校正基体效应,而对Cl,S和F元素则用经验系数法进行基体校正。各元素的探测限(ppm)分别为:As 2.7,Ga 2.4,Co 2.8,Ni 2.5,Br 1.0,Cl,S 5.0,F 500。方法的精密度和准确度与其它化学方法相当,是一种简便快速和较灵敏的分析方法。
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| 关 键 词： | 非金属元素 测定 X荧光光谱法 |
DETERMINATION OF As, Ga, Co, Ni, Br, CI, S AND F IN GEOLOGICAL SAMPLES BY X-RAY FLUORESCENCE SPECTROMETRY |
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| Xiao Deming Wu Chaohui. DETERMINATION OF As, Ga, Co, Ni, Br, CI, S AND F IN GEOLOGICAL SAMPLES BY X-RAY FLUORESCENCE SPECTROMETRY[J]. Uranium Geology, 1990, 0(5) |
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| Authors: | Xiao Deming Wu Chaohui |
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| Affiliation: | Xiao Deming Wu Chaohui |
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| Abstract: | This paper describes a XRF method for the determination of micro amounts of As, Ga, Co, Ni, Br, CI, S and F in geological samples. The samples were prepared as briquets. The matrix effect was corrected by the scattered target-line ratio method for As, Ga, Co, Ni, Br and by the empirical influence coefficients for Cl, S, F. The lower limits of detection for As, Ga, Co, Ni, Br, Cl, S and F are 2. 7, 2. 4, 2. 8, 2. 5, 1. 0, 5. 0, 5. 0 and 500 ppm, respectively. Accuracy and precision of the method are comparable to those of the chemical analysis. This is a simple, rapid and more sensitive analytical method. |
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| Keywords: | Non-metal element Determination X-ray spectrometry |
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