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Scattering and diffraction by a single crack: an accuracy analysis of the rotated staggered grid |
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| Authors: | Oliver S Krüger Erik H Saenger Serge A Shapiro |
| Institution: | Fachrichtung Geophysik, Freie Universität Berlin, Malteser Str. 74-100,;Haus D, 12249 Berlin, Germany. E-mails: (OSK);(EHS);(SAS) |
| Abstract: | |
| Keywords: | accuracy cracked media finite differences scattering and diffraction |