Advances in energy-dispersive X-ray fluorescence

Recently, two new instruments for X-ray fluorescence analysis (XRF) with interesting features for geochemical applications came to the market. Both instruments were designed to improve the peak to background ratio, the principal factor limiting the sensitivity of XRF. Total reflection XRF (TXRF) was designed to analyse extremely small sample amounts. An instrument, using polarised X-rays (P-XRF) for excitation, is designed to reduce scattered background in spectra of bulk samples. The performance of both instruments was compared with conventional XRF-methods and ICP/MS. Results for GXR-1, GXR-2, GXR-3, GXR-4 and GXR-6 obtained with TXRF and P-XRF are in good agreement with literature data. The effective amount of sample, analysed by TXRF was 200 μg only and detection limits of ~ l μg/g were achieved. P-XRF shows considerable improved detection limits (0.25–0.5 μg/g) for bulk samples for elements with atomic numbers 42–51 (Mo-Sb) compared with conventional XRF-methods.     

Analysis of DNAPL infiltration in a medium with a low-permeable lens

In this paper we study the infiltration of DNAPL in a porous medium containing a single low-permeable lens. Our aim is to determine whether or not DNAPL infiltrates into the lens. A key role is played by the capillary pressure: DNAPL cannot infiltrate into the lens unless the capillary pressure exceeds the entry pressure of the lens. In the model this is reflected by an interface condition, the extended capillary pressure condition. To derive analytical approximations we first consider a steady-state DNAPL plume in a homogeneous medium. This results in an estimate of the DNAPL plume width as a function of depth, and an asymptotic solution for small saturations. Assuming that the extent of the lens is much larger than the width of the unperturbed DNAPL plume in the homogeneous medium, we derive an explicit criterion for DNAPL infiltration into the lens in terms of a critical inflow rate. A numerical algorithm is presented in which the extended capillary pressure condition is incorporated. The numerical and analytical results show good qualitative agreement. This revised version was published online in August 2006 with corrections to the Cover Date.     

X射线荧光测井井液的影响与校正

X射线荧光测井中 ,井液位于井下探管与井壁之间 ,它的影响不但表现在对特征X射线的吸收 ,而且表现在对源初级射线和特征 X射线的散射。井液的校正采用硬件与软件相结合的方法 ,在硬件上 ,使含有探测器的部分制成单独的短臂 ,有效地保证了探测窗与井壁的良好接触 ;在软件上 ,提出的双散射峰法和散射峰 -逃逸峰法 ,能够校正 0 - 10 mm厚的井液对 X射线荧光测井结果的影响     

岩盐及芒硝中各种化合物质量分数的计算

本文以等物质的量的反应规则建立了岩盐、芒硝中各种化合物的质量分数的计算公式。这些公式既符合法定计量单位的要求，又方便计算。     

Surface chemical analysis in coal preparation research: complementary information from XPS and ToF-SIMS

The application of X-ray photoelectron spectroscopy (XPS) to coal surface characterisation for preparation research is described. Progress towards the acquisition of complementary surface chemical information by time-of-flight secondary ion mass spectrometry (ToF-SIMS) is also discussed. Surface-based beneficiation techniques such as flotation are assuming greater importance as the proportion of fines in raw coal increases due to the proliferation of high capacity mining methods. A necessary condition for the floatability of a coal particle is adequate hydrophobicity, and the degree of hydrophobicity of the flotation concentrate is one factor influencing the ease with which its dewatering can be affected. The hydrophobicity of a coal is very difficult to measure directly because of microporosity, and it is often necessary to deduce the degree of hydrophobicity from a knowledge of the surface chemistry. XPS is able to provide sufficient analytical data to allow relative levels of hydrophobicity to be estimated. In principle, ToF-SIMS should be able to supply additional information enabling refinement of such estimates; however, there are insufficient data at present to allow the ionic fragments detected to be related to specific functional groups at the coal surface.     

X射线荧光测井的井液效应及其校正

本文从Ｘ射线的性质，以及Ｘ射线与物质作用的机理出发，对井液效应进行了研究，并对其影响过程进行模拟。在理想井液模型上，推导出Ｘ射线活度与钻孔参数的数理关系。在此基础上，进一步研究得到了能适应野外多变情况的井液效应校正公式（ＣＢＷＥ）和方法。     

气相色谱和薄层色谱法在形态分析中的应用

评述了气相色谱和薄层色谱法用于氯、溴、碘、硫、硒、碲、铬、氮、磷、砷、钒、碳、锡、铅、铁和汞１６种元素的不同形态分析的进展。这些形态包括不同价态、有机态、无机态、阳离子和阴离子态等。由于气相色谱和薄层色谱法都具有分离和检测两种功能结合的特点，因此它们是用于元素形态分析的有效和方便的方法。引用１９８０～１９９４年文献９２篇     

深层搅拌桩复合地基的有限元分析

介绍了用自行编制的适用于群桩地基基础应力、变形分析的三维非线性程序对一种有代表性的群桩进行分析的情况。讨论了深层搅拌桩复合地基的工作机制和应力、变形分布特点，并通过多种方案的比较就不同的荷载水平、桩长、桩上置换率、土层分布、桩身变形模量等诸因素对地基沉降、桩端应力、桩的承载率的影响和规律进行了研究。     

原位磁化X射线粉末衍射法测还原铁粉的微观磁致伸缩系数

首次报导X射线粉末衍射法测量铁粉晶胞的磁致伸缩系数。还原铁粉样品原位磁化后 ,铁立方晶胞产生磁致伸缩效应 ,晶胞参数的变化引起衍射峰位置和晶面间距的变化。实验测得铁晶胞λ1 0 0 为 3 .3 3× 10 - 4,此结果表明铁晶胞的微观磁致伸缩系数比棒状、薄膜或粉末压片的系数大约 16倍。对此现象进行了合理的理论解释 ,指出大块材料中的粉末多晶之间具有较大的空隙 ,从而使得宏观磁致伸缩系数变小     

CHARACTERIZATION OF DEFORMATION AND X-RAY PETROFABRICS IN THE MIDDLE PART OF THE WAHONGSHAN FAULT ZONE, QINGHAI PROVINCE, NORTHWESTERN CHINA

The Wahongshan fault zone in Qinghai province is one of the most important faults in westem China. In this paper, deformation and X-ray petrofabrics have been studied in the middle segment of the fault. The results show that the formation of the fault zones can be divided into two major stages: ductile shear deformation stage and brittle deformation stage. The early stage ductile shearing leads to the formation of the NW-NNW trending mylonite zones along the fault, which is intensely cut by the late-formed brittle faults. X-ray petrofabrics of rocks near the faults indicate that the minerals in the tectonites show a great degree of orientation in the alignment. The quartz, which is a very important mineral in the tectonites, is deformed by basal face gliding or near basal face gliding, and sometimes by prismatic face sliding, which indicates that the rocks are deformed in epithermal to mesothermal or mesothermal environment, and the dynamic recrystallization also plays an important role in the formation