Niobium and Tantalum Concentrations in NIST SRM 610 Revisited

Niobium and Ta concentrations in MPI‐DING and USGS (BCR‐2G, BHVO‐2G, BIR‐1G) silicate rock glasses and the NIST SRM 610–614 synthetic soda‐lime glasses were determined by 193 nm ArF excimer laser ablation and quadrupole ICP‐MS. Measured Nb and Ta values of MPI‐DING glasses were found to be consistently lower than the recommended values by about 15% and 25%, respectively, if calibration was undertaken using commonly accepted values of NIST SRM 610 given by Pearce et al. Analytical precision, as given by the 1 s relative standard deviation (% RSD) was less than 10% for Nb and Ta at concentrations higher than 0.1 μg g^?1. A significant negative correlation was found between logarithmic concentration and logarithmic RSD, with correlation coefficients of ‐0.94 for Nb and ‐0.96 for Ta. This trend indicates that the analytical precision follows counting statistics and thus most of the measurement uncertainty was analytical in origin and not due to chemical heterogeneities. Large differences between measured and expected Nb and Ta in glasses GOR128‐G and GOR132‐G are likely to have been caused by the high RSDs associated with their very low concentrations. However, this cannot explain the large differences between measured and expected Nb and Ta in other MPI‐DING glasses, since the differences are normally higher than RSD by a factor of 3. Count rates for Nb and Ta, normalised to Ca sensitivity, for the MPI‐DING, USGS and NIST SRM 612–614 glasses were used to construct calibration curves for determining NIST SRM 610 concentrations at crater diameters ranging from 16 (im to 60 μm. The excellent correlation between the Nb/Ca_1μgg‐1 signal (Nb represents the Nb signal intensity; Ca_{1μg g‐1} represents the Ca sensitivity) and Nb concentration, and between the Ta/Ca_{1μg g‐1} signal (where Ta represents the Ta signal intensity; Ca_{1μg g‐1} represents the Ca sensitivity) and Ta concentration (R²= 0.9992–1.00) in the various glass matrices suggests that matrix‐dependent fractionation for Nb, Ta and Ca was insignificant under the given instrumental conditions. The results confirm that calibration reference values of Nb and Ta in NIST SRM 610 given by Pearce et al. are about 16% and 28% lower, respectively. We thus propose a revision of the preferred value for Nb from 419.4 ± 57.6 μg g^?1 to 485 ± 5 μg g^?1 (1 s) and for Ta from 376.6 ± 77.6 μg g^?1 to 482 ± 4 μg g^?1 (Is) in NIST SRM 610. Using these revised values for external calibration, most of the determined average values of MPI‐DING, USGS and NIST SRM 612–614 reference glasses agree within 3% with the calculated means of reported reference values. Bulk analysis of NIST SRM 610 by standard additions using membrane desolvation ICP‐MS gave Nb = 479 ± 6 μg g^?1 (1 s) and Ta = 468 ± 7 μg g^?1 (1 s), which agree with the above revised values within 3%.     

High Sensitivity Analysis of Trace Element-Poor Geological Reference Glasses by Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS)

Fifty-two trace elements in NIST SRM 614, 616 and MPI-DING BM90/21-G glass reference materials as well as in NIST SRM 612, USGS BCR2-G and other MPI-DING reference glasses (KL2-G, GOR132-G, GOR128-G, ATHO-G, Tl-G, StHs6/80-G and ML3B-G) were determined by laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS). Accurate ultra-low trace element abundances in the NIST SRM 614, 616 and BM90/21-G reference glasses down to lower ng g⁻¹ levels were determined with relative standard deviations (RSD) of less than 10%. Limits of detection using He as carrier gas were up to two times lower than with Ar and were 0.004 to 0.12 μg g⁻¹ for elements of lower mass numbers (amu < 85) and 0.002 to 0.06 μg g⁻¹ for elements having amu < 85. The measured concentrations generally agree within 15% with previous studies except for B in NIST SRM 614 and 616, which appears to be heterogeneously distributed, and Co, Zn, Ga and Ag in NIST SRM 616 for which the existing data set is too small to evaluate the discrepancies. New values for As (0.593 μg g⁻¹), Ag (0.361 μg g⁻¹) and Cd (0.566 μg g⁻¹) in NIST SRM 614 and new values for Na (94864 μg g⁻¹) and As (0.276 μg g⁻¹) in NIST SRM 616 are reported.     

Precise and Accurate Doping of Nanoporous Silica Gel for the Synthesis of Trace Element Microanalytical Reference Materials

This study presents an experimental procedure to fabricate high‐purity silica glass containing a selected element at a specified mass fraction. The procedure was used to prepare glasses doped with trace‐level mass fractions of Ti with the goal of improving analytical confidence when measuring trace elements in quartz. Systematic tests were performed to determine the ideal conditions and procedures for doping nanoporous silica gel with the highest efficiency of dopant recovery. Silica gel was cleaned in concentrated HCl, immersed in a non‐polar doping medium at a controlled pH and doped with precise quantities of ICP‐MS standard solution. Using liquids composed of longer chain molecules as the doping medium diminishes recovery, suggesting that large molecules could obstruct nanopores to inhibit capillary uptake of the dopant. A control experiment using crystalline quartz reinforced the effectiveness of nanoporous silica gel for doping with trace‐level precision. Layered aggregates of silica gel doped with different Ti mass fractions were hot‐pressed to create multi‐layered reference materials that were analysed with multiple techniques at a variety of spatial scales. Analyses at the intra‐grain scale (cathodoluminescence scanning electron microscopy, electron probe microanalysis), at the single grain scale (SIMS), at the sample layer scale (EPMA, laser ablation‐ICP‐MS) and at the bulk scale (ICP‐OES) demonstrated acceptable homogeneity at sample volumes characteristic of most microanalysis techniques and show that nanoporous silica gel holds promise as a highly retentive doping substrate for preparing reference materials for laser‐, electron‐ and ion‐beam microanalysis.     

Capturing the complete stress–strain behaviour of jointed rock using a numerical approach

This paper presents the results of a series of numerical experiments using the synthetic rock mass (SRM) approach to quantify the behaviour of jointed rock masses. Field data from a massive sulphide rock mass, at the Brunswick mine, were used to develop a discrete fracture network (DFN). The constructed DFN model was subsequently subjected to random sampling whereby 40 cubic samples, of height to width ratio of two, and of varying widths (0.05 to 10 m) were isolated. The discrete fracture samples were linked to 3D bonded particle models to generate representative SRM models for each sample size. This approach simulated the jointed rock mass as an assembly of fractures embedded into the rock matrix. The SRM samples were submitted to uniaxial loading, and the complete stress–strain behaviour of each specimen was recorded. This approach provided a way to determine the complex constitutive behaviour of large‐scale rock mass samples. This is often difficult or not possible to achieve in the laboratory. The numerical experiments suggested that higher post‐peak modulus values were obtained for smaller samples and lower values for larger sample sizes. Furthermore, the observed deviation of the recorded post‐peak modulus values decreased with sample size. The ratio of residual strength of rock mass samples per uniaxial compressive strength intact increases moderately with sample size. Consequently, for the investigated massive sulphide rock mass, the pre‐peak and post‐peak representative elemental volume size was found to be the same (7 × 7 × 14 m). Copyright © 2015 John Wiley & Sons, Ltd.     

Compositional Heterogeneity in NIST SRM 610-617 Glasses

Extensive compositional heterogeneity is shown to affect at least twenty four of the doped trace elements in the NIST SRM 610-617 glasses.
Compositional profiling and mapping using laser ablation ICP-MS reveals that all NIST SRM 610-617 wafers examined here contain domains that are significantly depleted in Ag, As, Au, B, Bi, Cd, Cr, Cs, Mo, Pb, Re, (Rh), Sb, Se, Te, Tl and W, and antithetically enriched in Cu (and Pt), with large enrichments in Cd, Fe and Mn also being encountered in some cases. These domains are visible in doubly polished wafers by unaided visual inspection and by transmitted light and schlieren microscopy. They occur in close proximity to the wafer perimeters and also as stretched and complexly folded forms within wafer interiors. The chemical and optical properties of these heterogeneous domains are consistent with those of compositional cords, a phenomenon of glass manufacture where glass bulk composition and physical properties are modified by loss of volatile components from the molten glass surface. The NIST SRM 610-617 glasses may be considered reliable reference materials for microanalysis of only between one half and two thirds of the trace elements with which they were doped, including Be, Mg, Sr, Ba, Sc, Y, REE, V, Zr, Hf, Nb, Ta, Th, U, Ga, In, Sn, Co, Ni and Zn. These elements show no evidence of significant heterogeneity, indicating that the original glass constituents and possible residues remaining in the furnace from preceding glass batch fusions were well homogenised during manufacture.     

Boron and Oxygen Isotope Composition of Certified Reference Materials NIST SRM 610/612 and Reference Materials JB-2 and JR-2

We present data on the concentration, the isotope composition and the homogeneity of boron in NIST silicate glass reference materials SRM 610 and SRM 612, and in powders and glasses of geological reference materials JB-2 (basalt) and JR-2 (rhyolite). Our data are intended to serve as references for both microanalytical and wet-chemical techniques. The δ¹¹ B compositions determined by N-TIMS and P-TIMS agree within 0.5% and compare with SIMS data within 2.5%. SIMS profiles demonstrate boron isotope homogeneity to better than δ¹¹ B = 2% for both NIST glasses, however a slight boron depletion was detected towards the outermost 200 μm of the rim of each sample wafer. The boron isotope compositions of SRM 610 and SRM 612 were indistinguishable. Glasses produced in this study by fusing JB-2 and JR-2 powder also showed good boron isotope homogeneity, both within and between different glass fragments. Their major element abundance as well as boron isotope compositions and concentrations were identical to those of the starting composition. Hence, reference materials (glasses) for the in situ measurement of boron isotopes can be produced from already well-studied volcanic samples without significant isotope fractionation. Oxygen isotope ratios, both within and between wafers, of NIST reference glasses SRM 610 and SRM 612 are uniform. In contrast to boron, significant differences in oxygen isotope compositions were found between the two glasses, which may be due to the different amounts of trace element oxides added at ten-fold different concentration levels to the silicate matrix.     

NIST SRM 610, 611 and SRM 612, 613 Multi-Element Glasses: Constraints from Element Abundance Ratios Measured by Microprobe Techniques

The SRM 600 series of glasses, SRM 611 to SRM 619, which nominally contain 500 (SRM 610, 611), 50 (SRM 612, 613), 1 (SRM 614, 615) and 0.02 (SRM 616, 617) μg g⁻¹ of sixty one elements are now being extensively used as microprobe standards. Recent compilations of the trace element concentrations, which include many new multi-element bulk analyses, do not all give the same value within the stated uncertainty; this observation appears to raise questions about the degree of homogeneity on a microscale reported from probe measurements. The ion microprobe cannot give absolute concentrations, but can accurately measure the abundance ratios between glasses of similar major element chemistry. Recent and new probe measurements show that, although the absolute concentrations are significantly lower than the nominal values, the average dilution factors are 12 : 1 : 0.02 : 0.0004 and close to weighed amounts. The consistency between the ratios of random samples of glasses (SRM 610/SRM 612 and SRM 611/SRM 613) strongly supports a high degree of homogeneity on all scales. The measured abundance ratios between two glasses can, therefore, act as a useful check on bulk measurement accuracy. A clear correlation in the SRM 610, 611/SRM 612, 613 ratios measured by ion probe and SRM 612 trace concentrations measured by bulk techniques demonstrates that SRM 610, 611 has a much more uniform trace content than SRM 612, 613.     

GIS 优化 SRM 储流函数模型变量与参数方法研究

水文模型的结构确定后,模型参数的选择对水文模型整体性能和水文预报结果的好坏有着至关重要的影响。为使得模型的输出值能够尽可能地接近实际值,文中结合数字高程模型(DEM)和流域地质资料,使用GIS方法分别从优化数据源和加入地质因素影响分析优化模型参数两方面入手,对SRM储流函数模型进行优化,并以北海道沙流川流域为例对上述方法进行检验,结果说明了方法的可行性。     

CMIP6地球工程模式比较计划（GeoMIP）概况与评述

太阳辐射管理地球工程是应对气候变化的备用措施。地球工程模式比较计划（GeoMIP）是第六次国际耦合模式比较计划（CMIP6）的重要组成部分。GeoMIP设计了一系列理想化地球工程试验,包括直接减少太阳辐射强度、向平流层注入硫酸盐气溶胶、向海表上空云层注入气溶胶凝结核、增加海水反照率等。在GeoMIP的统一模拟框架下开展地球工程模拟试验,进一步揭示了不同地球工程措施对全球气候的影响和作用机理,从而帮助我们更好地认知气候系统对地球工程的响应过程。更多的中国气候模式参加GeoMIP将提升我国在地球工程研究和国际气候谈判中的国际影响力和话语权。     

超导岩样磁力仪的研制

超导岩样磁力仪是以超导量子干涉器（SQUID）为磁传感器用来测量岩样剩磁的仪器,是研究岩石磁学和古地磁学的重要手段。它比常规的古地磁仪器——无定向磁力仪、旋转磁力仪具有灵敏度高、响应时间短、动态范围大、又可三分量同时测量等优点,满足了弱磁岩样测量的要求。本文叙述了超导测磁的理论基础,仪器的组成,原理,研制情况及实测结果。