X射线衍射增强成像的折射角信息提取算法综述

基金项目:

国家自然科学基金(10575059)

详细信息

Review on Refraction-Angle Extraction Methods in Diffraction Enhanced Imaging

1. Department of Engineering Physics, Tsinghua University, Beijing, 100084, China;
2. Key Laboratory of Particle & Radiation Imaging(Tsinghua University), Ministry of Education, Beijing, 100084, China

摘要: 本文简要地介绍了衍射增强成像方法的物理原理,根据折射角信息提取所需要的DEI图像采样的数量进行分类,分别详细介绍了利用两幅DEI图像、三幅DEI图像以及多幅DEI图像进行折射角信息提取的算法,并依次分析了它们的特点及性能。对于不同的实际应用需要,灵活的选择使用这些折射角信息提取方法,可以获得更好的图像效果。
- 衍射增强成像 /
- 折射角信息提取算法 /
- 相衬成像
Abstract: In this paper, the principles of diffraction enhanced imaging (DEI) are introduced firstly. Then several refraction-angle extraction methods are presented in detail and classified as three categories in accordance with two images, three images and multiple images. Finally, their characteristics and performances are discussed adequately. The quality of refraction-angle images can be improved by choosing proper methods according to the practical demand.
- Diffraction Enhanced Imaging /
- Refraction-angle extraction method /
- Phase-contrast imaging