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同幅双速跟踪成像CCD相机模拟电路系统设计
引用本文:李勇明,李彬华,王慧娟,卢诚.同幅双速跟踪成像CCD相机模拟电路系统设计[J].天文研究与技术,2007,4(4):376-382.
作者姓名:李勇明  李彬华  王慧娟  卢诚
作者单位:昆明理工大学信息工程与自动化学院 云南昆明650051
摘    要:讨论了同幅双速跟踪成像技术对CCD相机系统的特殊要求,详细地介绍了该相机前端模拟系统的设计思想、系统结构和主要的电路模块。对系统中一些关键电路模块进行了仿真和测试,并对仿真和测试结果进行比较分析,以检验电路系统设计的合理性。

关 键 词:CCD相机  模拟电路  低噪声  仿真  测试
文章编号:1672-7673(2007)04-0376-07
收稿时间:2007-02-13
修稿时间:2007-03-16

Design of Analog Circuit and System for a CCD Camera with Dual-Speed Tracking Imaging on Same Frame
LI Yong-ming,LI Bin-hua,WANG Hui-juan,LU Cheng.Design of Analog Circuit and System for a CCD Camera with Dual-Speed Tracking Imaging on Same Frame[J].Astronomical Research & Technology,2007,4(4):376-382.
Authors:LI Yong-ming  LI Bin-hua  WANG Hui-juan  LU Cheng
Abstract:In order to improve accuracy of differential measurement for positions of moving objects in space(such as satellites,debris and asteroids) with respect to the stars,we developed a novel CCD imaging technique named as Dual-Speed Tracking Imaging on Same Frame(DSTIS).Our main thought is that one half of the CCD photosensitive area is used to image still objects in stare mode and another half to image moving objects in drift scan mode at the same time.With this technique,both moving objects and still objects can be tracked and imaged simultaneously without the elongation of their images on the same CCD frame.The final images of the two kinds of objects can be centered with high accuracy,and then the more accurate positions of moving objects in space can be determined by the differential measurement widely used in astrometry.This paper discusses some special requirements of the CCD imaging system with the DSTIS technique,and then presents the design philosophy for the analog circuit and system of the DSTIS camera in detail,the system architecture and some major modules of circuitry.Some key modules of circuitry in the imaging system are simulated and tested.The simulation and testing results are comparatively analyzed so as to check the rationality and feasibility of our design.
Keywords:CCD camera  analog circuit  low noise  simulation  testing
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