| 长度基线溯源问题探讨 |
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| 引用本文： | 付子傲,朱江,孙方飞,包欢,贾真,薛英.长度基线溯源问题探讨[J].测绘学院学报,2011(3). |
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| 作者姓名： | 付子傲 朱江 孙方飞 包欢 贾真 薛英 |
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| 作者单位： | 信息工程大学测绘学院;郑州测绘学校; |
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| 摘 要： | 介绍了长度基线的3种校准方式,分析了因瓦尺和光电测距仪校准基线的不确定度,在1 000 m距离上,二者都能达到1 mm的扩展不确定度(k=2)。用3台精密测距仪在芬兰、北京、郑州、成都等地基线场的6期实验数据,说明维塞拉基线、因瓦尺基线、光电测距基线三者之间存在3 mm/km的系统性差异,提出了解决差异的建议。
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| 关 键 词： | 长度基线 校准 因瓦尺 光电测距仪 维塞拉干涉仪 |
Discussion about Traceability of Length Baseline |
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| FU Zi-ao,ZHU Jiang,SUN Fang-fei,BAO Huan,JIA Zhen,XUE Ying.Discussion about Traceability of Length Baseline[J].Journal of Institute of Surveying and Mapping,2011(3). |
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| Authors: | FU Zi-ao ZHU Jiang SUN Fang-fei BAO Huan JIA Zhen XUE Ying |
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| Institution: | FU Zi-ao1,ZHU Jiang1,SUN Fang-fei2,BAO Huan1,JIA Zhen1,XUE Ying1 (1.Institute of Surveying and Mapping,Information Engineering University,Zhengzhou 450052,China,2.Zhengzhou School for Surveying and Mapping,Zhengzhou 450015,China) |
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| Abstract: | Baseline of length can be calibrated with three types of instrument.Uncertainty of calibration with invar tape and electro-optical distance measurement instrument were analyzed.Expanded uncertainty(k=2) of the two kinds baseline reached 1 mm in 1 000 m distance.Systemic difference of the three calibration methods about 3 mm/km described by using six times experiment data were measured in Finland,Beijing,Zhengzhou and Chengdu with three EDM instruments.Some solutions were proposed. |
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| Keywords: | baseline of length calibration invar tape electro-optical distance measurement instrument Visl interference comparator |
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