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The mechanism of post-rift fault activities in Baiyun sag,Pearl River Mouth basin
Institution:1. CAS Key Lab of Marginal Sea Geology, South China Sea Institute of Oceanology, Chinese Academy of Sciences, Guangzhou 510301, China;2. Zhanjiang Branch of CNOOC Limited, Zhanjiang 524057, China
Abstract:Post-rift fault activities were often observed in deepwater basins, which have great contributions to oil and gas migration and accumulation. The main causes for post-rift fault activities include tectonic events, mud or salt diapirs, and gravitational collapse. In the South China Sea continental margin, post-rift fault activities are widely distributed, especially in Baiyun sag, one of the largest deepwater sag with its main body located beneath present continental slope. During the post-rift stage, large population of faults kept active for a long time from 32 Ma (T70) till 5.5 Ma (T10). Seismic interpretation, fault analysis and analogue modeling experiments indicate that the post-rift fault activities in Baiyun sag between 32 Ma (T70) and 13.8 Ma (T30) was mainly controlled by gravity pointing to the Main Baiyun sag, which caused the faults extensive on the side facing Main Baiyun sag and the back side compressive. Around 32 Ma (T70), the breakup of the continental margin and the spreading of the South China Sea shed a combined effect of weak compression toward Baiyun sag. The gravity during post-rift stage might be caused by discrepant subsidence and sedimentation between strongly thinned sag center and wing areas. This is supported by positive relationship between sedimentation rate and fault growth index. After 13.8 Ma (T30), fault activity shows negative relationship with sedimentation rate. Compressive uplift and erosion in seismic profiles as well as negative tectonic subsiding rates suggest that the fault activity from 13.8 Ma (T30) to 5.5 Ma (T10) might be controlled by the subductive compression from the Philippine plate in the east.
Keywords:Slope area  Post-rift fault activities  Gravity  Analogue modeling
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