| 矿物中单个有机包裹体测试与TOF-SIMS技术的应用 |
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| 引用本文： | 李荣西,周生斌.矿物中单个有机包裹体测试与TOF-SIMS技术的应用[J].矿物学报,2000,20(2):172-176. |
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| 作者姓名： | 李荣西 周生斌 |
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| 作者单位： | 1. 中国科学院地球化学研究所矿床地球化学开放研究实验室,贵阳,550002;长安大学地球科学系,西安,710054
2. 吐哈石油勘探开发研究院试验中心,哈密,839009 |
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| 基金项目： | 中国博士后科学基金!(1999/10)，贵州省自然科学基金!(993091)资助 |
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| 摘 要： | 有机包裹体是一种富含有机质的矿物流体包裹体。单个有机包裹体在研究成岩成矿作用和没油气成藏历史过程方面具有重要的实用价值。目前常用于单个有机包裹体分析的技术有荧光光谱、显微傅立叶红外光谱、激光拉曼光谱和二次离子质谱（ＳＩＭＳ）等。本文对这些方法的应用现代和存在的问题进行了客观的分析，同时还介绍了一种可用于单个有机包裹体分析的新体分析的新技术－飞行时间二次离子质谱（ＴＯＦ－ＳＩＭＳ），对其分析原理、方
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| 关 键 词： | 有机包裹体 分析测试 矿物 TOF－SIMS |
ANALYTICAL TECHNIQUES FOR INDIVIDUAL ORGANIC INCLUSIONS AND THE APPLICATION OF TOF-SIMS |
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| Li Rongxi,Zhou Shengbin.ANALYTICAL TECHNIQUES FOR INDIVIDUAL ORGANIC INCLUSIONS AND THE APPLICATION OF TOF-SIMS[J].Acta Mineralogica Sinica,2000,20(2):172-176. |
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| Authors: | Li Rongxi Zhou Shengbin |
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| Abstract: | Organic inclusions are a kind of mineral fluid inclusions, which mainly contain organic matter. Individual organic inclusions have a valuable application in investigating the process and history of ore and oil/gas formation and accumulation. Many techniques including fluorescence spectrometry, Micro\|FT.IR, LRM and SIMS now have been widely used to analyze individual organic inclusions, but problems still remain with samples and techniques themselves. A new microanalysis technique, Time\|Flight\|Secondary Ion Mass Spectrometry (TOF\|SIMS) is recommended in the paper, which is one of the most prospective techniques for analyzing individual organic inclusions contained in minerals. |
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| Keywords: | organic inclusion analytical technique TOF-SIMS |
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