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Solar EUV emission line profiles of Si ii and Si iii and their center to limb variations |
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| Authors: | K R Nicolas G E Brueckner R Tousey D A Tripp O R White R G Athay |
| Institution: | (1) E. O. Hulbert Center for Space Research, U.S. Naval Research Laboratory, 20375 Washington, D.C., U.S.A.;(2) Weber State College, Ogden, Utah, U.S.A.;(3) High Altitude Observatory, National Center for Atmospheric Research, 80303 Boulder, Colo., U.S.A. |
| Abstract: | Spectral line profiles of Si ii and Si iii are presented which were observed both at solar center and near the quiet solar limb with the Naval Research Laboratory EUV spectrograph of ATM/SKYLAB. Absolute intensities and line profiles are derived from the photographic data. A brief discussion is given of their center-to-limb variations and of the optical thickness of the chromosphere in these lines. Nonthermal broadening velocities are found for the optically thin lines from their full width at half maximum intensity (FWHM).Also at High Altitude Observatory for part of this work.The National Center for Atmospheric Research is sponsored by the National Science Foundation. |
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