首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Comparison of age distributions estimated from environmental tracers by using binary-dilution and numerical models of fractured and folded karst: Shenandoah Valley of Virginia and West Virginia, USA
Authors:Richard M Yager  L Niel Plummer  Leon J Kauffman  Daniel H Doctor  David L Nelms  Peter Schlosser
Institution:1. US Geological Survey, 30 Brown Rd, Ithaca, NY, 14850, USA
2. US Geological Survey, 12201 Sunrise Valley Dr., Reston, VA, 20192, USA
3. US Geological Survey, 810 Bear Tavern Rd, West Trenton, NJ, 08628, USA
4. US Geological Survey, 1730 East Parham Road, Richmond, VA, 23228, USA
5. Earth and Environmental Sciences, Lamont-Doherty Earth Observatory, 139 Comer, 61 Route 9W, Palisades, NY, 10964, USA
Abstract:Measured concentrations of environmental tracers in spring discharge from a karst aquifer in the Shenandoah Valley, USA, were used to refine a numerical groundwater flow model. The karst aquifer is folded and faulted carbonate bedrock dominated by diffuse flow along fractures. The numerical model represented bedrock structure and discrete features (fault zones and springs). Concentrations of 3H, 3He, 4He, and CFC-113 in spring discharge were interpreted as binary dilutions of young (0–8  years) water and old (tracer-free) water. Simulated mixtures of groundwater are derived from young water flowing along shallow paths, with the addition of old water flowing along deeper paths through the model domain that discharge to springs along fault zones. The simulated median age of young water discharged from springs (5.7  years) is slightly older than the median age estimated from 3H/3He data (4.4  years). The numerical model predicted a fraction of old water in spring discharge (0.07) that was half that determined by the binary-dilution model using the 3H/3He apparent age and 3H and CFC-113 data (0.14). This difference suggests that faults and lineaments are more numerous or extensive than those mapped and included in the numerical model.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号