Characterization of the Si:As Blocked Impurity Band (BIB) Detector in Keck's Long Wavelength Spectrometer (LWS)

Keck's Long Wavelength Spectrometer (LWS), is the facility instrument used for imaging and spectroscopy in the wavelength range of 3–28 μm at the Keck Observatory. LWS uses an 128 × 128 Si:As blocked impurity band (BIB) array manufactured by the Boeing Corporation. This paper discusses the method used for optimizing the detector's operating parameters at a temperature of 8.5 K and bias voltage of 1.2 V. A process for characterizing detective quantum efficiency of BIB detectors is also presented. This revised version was published online in July 2006 with corrections to the Cover Date.