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P‐wave stacking‐velocity tomography for VTI media
Authors:Vladimir Grechka  res Pech  Ilya Tsvankin
Institution:Center for Wave Phenomena, Colorado School of Mines, Golden, CO 80401-1887, USA
Abstract:A major complication caused by anisotropy in velocity analysis and imaging is the uncertainty in estimating the vertical velocity and depth scale of the model from surface data. For laterally homogeneous VTI (transversely isotropic with a vertical symmetry axis) media above the target reflector, P‐wave moveout has to be combined with other information (e.g. borehole data or converted waves) to build velocity models for depth imaging. The presence of lateral heterogeneity in the overburden creates the dependence of P‐wave reflection data on all three relevant parameters (the vertical velocity VP0 and the Thomsen coefficients ε and δ) and, therefore, may help to determine the depth scale of the velocity field. Here, we propose a tomographic algorithm designed to invert NMO ellipses (obtained from azimuthally varying stacking velocities) and zero‐offset traveltimes of P‐waves for the parameters of homogeneous VTI layers separated by either plane dipping or curved interfaces. For plane non‐intersecting layer boundaries, the interval parameters cannot be recovered from P‐wave moveout in a unique way. Nonetheless, if the reflectors have sufficiently different azimuths, a priori knowledge of any single interval parameter makes it possible to reconstruct the whole model in depth. For example, the parameter estimation becomes unique if the subsurface layer is known to be isotropic. In the case of 2D inversion on the dip line of co‐orientated reflectors, it is necessary to specify one parameter (e.g. the vertical velocity) per layer. Despite the higher complexity of models with curved interfaces, the increased angle coverage of reflected rays helps to resolve the trade‐offs between the medium parameters. Singular value decomposition (SVD) shows that in the presence of sufficient interface curvature all parameters needed for anisotropic depth processing can be obtained solely from conventional‐spread P‐wave moveout. By performing tests on noise‐contaminated data we demonstrate that the tomographic inversion procedure reconstructs both the interfaces and the VTI parameters with high accuracy. Both SVD analysis and moveout inversion are implemented using an efficient modelling technique based on the theory of NMO‐velocity surfaces generalized for wave propagation through curved interfaces.
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