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Remote sensing of spider mite damage in California peach orchards |
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| Authors: | Eike Luedeling Adam Hale Minghua Zhang Walter J Bentley L Cecil Dharmasri |
| Institution: | 1. Department of Land Air and Water Resources, University of California, Davis, CA 95616, USA;2. University of California Integrated Pest Management Program, Kearney Agriculture Center, Parlier, CA 93648, USA;3. Syngenta Crop Protection, Inc., Greensboro, NC 27409, USA |
| Abstract: | Remote sensing techniques can decrease pest monitoring costs in orchards. To evaluate the feasibility of detecting spider mite damage in orchards, we measured visible and near infrared reflectance of 1153 leaves and 392 canopies in 11 peach orchards in California. Pairs of significant wavelengths, identified by Partial Least Squares regression, were combined into normalized difference indices. These and 9 previously published indices were evaluated for correlation with mite damage. |
| Keywords: | Aerial imagery Integrated pest management Partial Least Squares (PLS) regression Prunus persica Remote sensing Spectral reflectance Spectroradiometer |
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