Dielectric constants of BeO,MgO, and CaO using the two-terminal method |
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Authors: | M. A. Subramanian R. D. Shannon B. H. T. Chai M. M. Abraham M. C. Wintersgill |
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Affiliation: | 1. Central Research and Development Department, E.I. du Pont de Nemours & Co., Inc., Experimental Station, Contribution No. 4997, 19880-0356, Wilmington, DE, USA 2. Allied Corporation, Corporate Headquarters, 07960, Morristown, NJ, USA 3. United States Naval Academy, 21402, Annapolis, MD, USA
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Abstract: | Using fused SiO2, CaF2, and SrF2 samples with accurately known dielectric constants, we have evaluated the accuracy and precision of two-terminal dielectric constant measurements on small single crystals using empirically determined edge corrections. Values of κ′ at 1 MHz of 3.836±0.05 for silica, 6.814±0.07 for CaF2 and 6.463±0.09 for SrF2 indicate an accuracy and precision of 1.0–1.5% for samples having areas of 0.05–1.0 cm2. Dielectric constants of BeO, MgO, and CaO measured by this technique are: BeO, κ′a=6.87 and κ′c=7.74; MgO, κ′= 9.90; and CaO, κ′=11.95 where κ′a and κ′c are the dielectric constants parallel to the a and c axes, respectively. Dielectric loss measurements on CaO in vacuum between 5–400 K at 10–105 Hz indicate significant dispersion at temperatures higher than 300 K, but the effect of the losses on the dielectric constant is less than 1% at 1 MHz and 300 K. |
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