| 从47届丹佛X射线会议看X射线荧光分析的发展 |
| |
| 引用本文： | 茅祖兴.从47届丹佛X射线会议看X射线荧光分析的发展[J].岩矿测试,1999,20(2):146-149156. |
| |
| 作者姓名： | 茅祖兴 |
| |
| 作者单位： | 国家标准物质研究中心,北京,100013 |
| |
| 摘 要： | 介绍了４７届丹佛Ｘ射线会议的简况。从会议的专题讲座和提交的学术论文可见，全反射Ｘ射线荧光，同步辐射，高能量分辨率超导检出器和聚毛细管光学透交易等新技术的引入，大大地推动了Ｘ射线荧光痕量分析和微分析的发展。
|
| 关 键 词： | X射线分析 痕量元素分析 微分析 丹佛会议 |
Development of XRF Analysis Viewed from the 47th Annual Denver X-ray Conference |
| |
| MAO Zu-xing.Development of XRF Analysis Viewed from the 47th Annual Denver X-ray Conference[J].Rock and Mineral Analysis,1999,20(2):146-149156. |
| |
| Authors: | MAO Zu-xing |
| |
| Abstract: | The paper briefly describes the 47th annual Denver Xray conference. From workshops arranged and academic reports presented to the conference, it is found that the introduction of many new advanced techniques, such as total reflection Xray fluorescence, synchrotron radiation, superconducting detectors with high energy resolution, polycapillary optics and so on, greatly pushes the development of trace and micro analysis forward.\=\= |
| |
| Keywords: | Denver Xray conference trace element analysis micro analysis |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
| 点击此处可从《岩矿测试》浏览原始摘要信息 |
| 点击此处可从《岩矿测试》下载免费的PDF全文 |
|
