利用加权积分能谱方法和复数道分析技术对薄层的识别与分析

薄层的识别与检测在反射地震学中是一个重要问题。当地下存在薄层或更为复杂地层的情况下，为消除地层内部吸收等因素对薄层识别的影响，本文在积分能谱的基础上提出了加权积分能谱，并通过模型证明了加权积分能谱比未加权积分能谱具有更好的薄层分辨效果，同时结合高分辨率复数道分析方法，证明了x＇ ( t) 的三瞬参数与d ( t) 褶积的函数具有更高的分辨率。

Thin layer distinguishing and analysis by weighted integral spectrum method and complex trace analysis technique

Thin layer distinguishing and inspection is an important issue in the reflection seismology． As there are thin layers or more complex formations underground，to eliminate the influences of some factors on the thin layer distinguishing，such as interior absorption of formation，we use the weighted integral spectrum on the basis of the integral energy spectrum，and prove through models that the weighted integral spectrum has better thin layer analysis effect than the unweighted integral energy spectrum． At the same time，we combine the high-resolution complex trace analysis method，to prove the three instantaneous parameter of x' ( t) and function of d ( t) convolution having higher resolutions．