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Why the interactions of fast ions with foils are distinct from charge exchange |
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| Authors: | E. Trä bert |
| Abstract: | The intensity patterns of some Rydberg line series in the X‐ray spectra of foil‐excited fast ion beams bear a resemblance to patterns seen with SN remnants or after charge exchange (CX). Closer scrutiny of the ion‐foil interaction process reveals why this is no more than a chance resemblance, because the underlying processes are very different. However, electron beam ion traps are suitable for CX observations (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
| Keywords: | atomic processes X‐rays: general |