Pixel-based correction for Charge Transfer Inefficiency in the Hubble Space Telescope Advanced Camera for Surveys

Charge Transfer Inefficiency (CTI) due to radiation damage above the Earth's atmosphere creates spurious trailing in Hubble Space Telescope ( HST ) images. Radiation damage also creates unrelated warm pixels – but these happen to be perfect for measuring CTI. We model CTI in the Advanced Camera for Surveys (ACS)/Wide Field Channel and construct a physically motivated correction scheme. This operates on raw data, rather than secondary science products, by returning individual electrons to pixels from which they were unintentionally dragged during readout. We apply our correction to images from the HST Cosmic Evolution Survey (COSMOS), successfully reducing the CTI trails by a factor of ∼30 everywhere in the CCD and at all flux levels. We quantify changes in galaxy photometry, astrometry and shape. The remarkable 97 per cent level of correction is more than sufficient to enable a (forthcoming) reanalysis of downstream science products and the collection of larger surveys.     

A Compilation of Silicon,Rare Earth Element and Twenty‐One other Trace Element Concentrations in the Natural River Water Reference Material SLRS‐5 (NRC‐CNRC)

The natural river water certified reference material SLRS‐5 (NRC‐CNRC) was routinely analysed in this study for major and trace elements by ten French laboratories. Most of the measurements were made using ICP‐MS. Because no certified values are assigned by NRC‐CNRC for silicon and 35 trace element concentrations (rare earth elements, Ag, B, Bi, Cs, Ga, Ge, Li, Nb, P, Rb, Rh, Re, S, Sc, Sn, Th, Ti, Tl, W, Y and Zr), or for isotopic ratios, we provide a compilation of the concentrations and related uncertainties obtained by the participating laboratories. Strontium isotopic ratios are also given.     

SLRS‐5 Elemental Concentrations of Thirty‐Three Uncertified Elements Deduced from SLRS‐5/SLRS‐4 Ratios

The fifth version of natural river water certified reference material, SLRS‐5 (National Research Council – Conseil National de Recherches Canada), is commonly used to control the quality of major and trace element measurements. Concentrations of silicon and thirty‐one uncertified trace elements have been reported for the certified reference material SLRS‐4, but they are not yet available for SLRS‐5. Here, SLRS‐5/SLRS‐4 ratios were deduced from SLRS‐5 and SLRS‐4 measurements by inductively coupled plasma‐atomic emission spectrometry and high‐resolution inductively coupled plasma‐mass spectrometry for certified elements and thirty‐five uncertified elements (rare earth elements, B, Bi, Br, Cs, Ga, Ge, Hf, Li, Nb, P, Pd, Rb, Rh, S, Sc, Si, Sn, Th, Ti, Tl, Y). Both reference materials were measured directly one after the other, so that calculated elemental ratios would not be notably influenced either by calibration uncertainties or by eventual long‐term instrumental drift. The computed ratios are in good agreement with those deduced from the certified values. We also report concentrations for thirty‐three uncertified elements in SLRS‐5 by combining the measured SLRS‐5/SLRS‐4 ratios and the published SLRS‐4 values. The resulting new data set provides target SLRS‐5 values, which will be useful in quality control procedures.